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using System;
using System.Collections.Generic;
using System.Linq;
using System.Text;
using System.Threading;
using System.Threading.Tasks;
namespace TinyCsvFileReader.App.ViewModels.GanttViewModel
{
public class ActualWorkloadViewModel
{
public Task TaskItemIsSelected(string taskId)
{
return Task.Run(() => TaskItems.Any(i => i.TaskId == taskId));
}
public string TaskName(string taskId)
{
return TaskItems.Where(i => i.TaskId == taskId).Select(t => t.TaskName).FirstOrDefault();
}
public decimal TotalTime(int taskId)
{
return TaskItems.Where(i => i.TaskId == taskId).Sum(t => t.TotalHours);
}
public List TaskItems { get; set; }
}
}
How do I find my vote before Election Day?
Posted Nov 11, 2018
According to the Center for American Progress, the Division of Elections tracks the ballot status of individual voters. Using this data, you will be able to determine your ballot status by entering your first and last name and the last four digits of your social security number. If you aren’t entered into the database, your ballot will have a status of „Not Voting
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Page(s): 1 2 3 4. Ccboot Game Menu Crack 21
This error also occurs if you are using a crack of the software which is illegal to use.1. Field of the Invention
The present invention relates to a method of manufacturing a MOS transistor having a protective film formed on its upper surface to prevent silicon in its channel region from depositing onto the sidewall of the gate electrode.
2. Description of the Prior Art
Heretofore, when a protective film made of an oxide film or the like is formed on the upper surface of the upper portion of a MOS transistor, in order to prevent an impurity doped in the channel region from depositing on the sidewall of the gate electrode, the upper surface of the channel region is covered with a sacrificial film such as a PSG film.
On the other hand, for the purpose of reducing the resistance of a gate electrode, a so-called self-aligning process is performed in which the gate electrode is formed by etching a polysilicon film through a photoresist mask such as a photoresist mask having a predetermined patterned pattern. A method of forming a gate electrode by etching a polysilicon film through a photoresist mask is performed, for instance, by one of the following methods:
(1) A method of forming an etching mask by sputtering an oxide film on the surface of a polysilicon film formed on a silicon substrate or a substrate made of other material and patterning the oxide film by RIE;
(2) A method of forming an etching mask by providing a photoresist having a predetermined pattern on a polysilicon film formed on a silicon substrate or a substrate made of other material by exposure using a reduced-projection exposure apparatus and patterning the polysilicon film by etching.
However, if etching is performed on the polysilicon film to form the gate electrode, a side wall of the gate electrode is damaged due to its reactivity with a polysilicon film, so that the gate electrode is not formed sharply. As a result, the effective gate length L of the transistor is reduced and the short channel effect is enhanced.Q:
What is the explanation of this boost that can be obtained in xor nodes?
I have just started using Agda and I don’t understand why when we don’t care about the order of the arguments we can do the following:
data Foo
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